backscattering of electrons

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• Rutherford backscattering spectroscopy — Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by… …   Wikipedia

• Coherent backscattering — In physics, coherent backscattering is observed when coherent radiation (such as a laser beam) propagates through a medium which has a large number of scattering centers (such as milk or a thick cloud) of size comparable to the wavelength of the… …   Wikipedia

• Proximity effect (electron beam lithography) — The proximity effect in electron beam lithography (EBL) is the phenomenon that the exposure dose distribution, and hence the developed pattern, is wider than the scanned pattern, due to the interactions of the primary beam electrons with the… …   Wikipedia

• Spectroscopie de rétrodiffusion de Rutherford — La spectroscopie de rétrodiffusion de Rutherford (Rutherford Backscattering Spectroscopy, RBS) est une technique d analyse utilisée en science des matériaux. Cette technique est parfois nommée spectrométrie de rétrodiffusion d ions à grande… …   Wikipédia en Français

• Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …   Wikipedia

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• XANES — X ray Absorption Near Edge Structure (XANES), also known as Near edge X ray absorption fine structure (NEXAFS) is a type of absorption spectroscopy. NEXAFS also at times used the abbreviation EXAFS. XANES data indicate the absorption peaks due to …   Wikipedia

• radiation measurement — ▪ technology Introduction       technique for detecting the intensity and characteristics of ionizing radiation, such as alpha, beta, and gamma rays or neutrons, for the purpose of measurement.       The term ionizing radiation refers to those… …   Universalium

• Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

• Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …   Wikipedia